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Dépôts en texte intégral
96
Mots clés
Growth
XRD
17Opp
Auger electron spectroscopy AES
Gallium oxide
2H
Magnetic anisotropy
Alloys
Topological insulators
PIXE
27Alda
Pulsed laser deposition
7550Ee
Nanostructures
Silica
RBS
Silicon carbide
Diffusion
Evaluation
Aluminum
Nanoparticles
Epitaxy
AC susceptibility
6855Jk
27Aldp
18O
Epitaxial growth
Passivation
3C-SiC
Nickel
Ferromagnetic resonance
Rutherford backscattering spectrometry RBS
Multilayer
Nuclear reaction analysis
Isotopic Tracing
Magnetic semiconductors
Channeling
Acoustic
18O resonance
Atomic Layer Deposition ALD
15N
Ion beam analysis
Indium oxide
7630Lh
Kossel diffraction
Zinc oxide
Pb centers
Oxidation
Adsorption
Metal-insulator transition
Transparent conductive oxide TCO
Periodic multilayer
Thin film
Nitridation
NRA
EPR
Ion implantation
Sputtering
Acoustic propreties of solid
Silicon
HfO2
Energy loss
Oxygen deficiency
Adsorption Isotherms
7550Pp
Magnetization curves
SiC
Defects
Thin films
Measurement
ALD
17O
Stable isotopic tracing
Capillary condensation
Charge exchange
Photoluminescence
NRP
Adsorbed layers
17Op
Al2O3
Raman spectroscopy
Gold
Hysteresis
Interface defects
Density functional theory
XPS
AFM
27Ald p&α
ADSORPTION DESORPTION HYSTERESIS
X-ray diffraction
Nuclear resonance profiling NRP
Ageing
GaMnAs
13C
Silicon Carbide
Low energy electron diffraction LEED
8140Ef
Aluminium
Topological defects
Annealing