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H. von Bardeleben, Jean-Louis Cantin, A. Parisini, A. Bosio, R. Fornari. Conduction mechanism and shallow donor properties in silicon-doped ɛ -G a 2 O 3 thin films: An electron paramagnetic resonance study. Physical Review Materials, 2019, 3 (8), pp.084601. ⟨10.1103/PhysRevMaterials.3.084601⟩. ⟨hal-03924960⟩
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Abdo Hassoun, Shahida Anusha Siddiqui, Slim Smaoui, İ̇lknur Ucak, Rai Naveed Arshad, et al.. Emerging Technological Advances in Improving the Safety of Muscle Foods: Framing in the Context of the Food Revolution 4.0. Food Reviews International, 2022, pp.1-42. ⟨10.1080/87559129.2022.2149776⟩. ⟨hal-04032389⟩
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Bingbing Xia, Jean-Jacques Ganem, Ian Vickridge, Emrick Briand, Sébastien Steydli, et al.. Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations. Applied Surface Science, 2022, 601, pp.154233. ⟨10.1016/j.apsusc.2022.154233⟩. ⟨hal-03907172⟩
Dépôts en texte intégral
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Mots clés
Ion beam analysis
Pulsed laser deposition
Photoluminescence
NRP
Oxygen deficiency
Isotopic Tracing
Low energy electron diffraction LEED
18O resonance
Kossel diffraction
Topological insulators
Defects
PIXE
Density functional theory
X-ray diffraction
RBS
Magnetic anisotropy
Gold
Adsorbed layers
Silicon carbide
Indium oxide
ADSORPTION DESORPTION HYSTERESIS
Alloy
Growth
6855Jk
Periodic multilayer
Multilayer
Thin films
Nickel
Sputtering
Oxidation
Raman spectroscopy
Topological defects
17Opp
Aluminum
Epitaxial growth
GaMnAs
Interface defects
Nuclear reaction analysis
Stable isotopic tracing
Diffusion
7550Ee
13C
Silicon
HfO2
EPR
Epitaxy
Acoustic propreties of solid
Ferromagnetic resonance
Zinc oxide
Silicon Carbide
Aluminium
Magnetic semiconductors
Nitridation
Acoustic
27Aldp
Adsorption Isotherms
Thin film
Alloys
AC susceptibility
Evaluation
27Ald p&α
17O
Rutherford backscattering spectrometry RBS
SiC
7630Lh
Ion implantation
17Op
27Alda
8140Ef
Capillary condensation
Nuclear resonance profiling NRP
Energy loss
ALD
Measurement
Atomic Layer Deposition ALD
2H
3C-SiC
Adsorption
18O
XRD
Pb centers
Ageing
Silica
XPS
Metal-insulator transition
Gallium oxide
Nanoparticles
Hysteresis
Annealing
Al2O3
Auger electron spectroscopy AES
Passivation
Charge exchange
Channeling
AFM
Transparent conductive oxide TCO
Magnetization curves
15N
7550Pp
Nanostructures